• DocumentCode
    1062816
  • Title

    Influence of an external resistor on second breakdowns in epitaxial planar transistors

  • Author

    Hane, Kunio ; Mogi, Makoto ; Suzuki, Tokio

  • Author_Institution
    Keio University, Yokohama, Japan
  • Volume
    26
  • Issue
    2
  • fYear
    1979
  • fDate
    2/1/1979 12:00:00 AM
  • Firstpage
    157
  • Lastpage
    158
  • Abstract
    The boundary condition between current mode and thermal mode second breakdowns is analyzed theoretically considering the influence of the external resistor. Also the triggering energy and distribution of temperature along collector n-layer for thermal mode second breakdown is discussed.
  • Keywords
    Boundary conditions; Delay effects; Difference equations; Electric breakdown; Epitaxial layers; Impurities; Poisson equations; Resistors; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1979.19395
  • Filename
    1479973
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1062816