Title :
The crystallography and texture of Co-based thin film deposited on Cr underlayers
Author :
Laughlin, David E. ; Wong, Bunsen Y.
Author_Institution :
Dept. of Metall. Eng. & Mater. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
11/1/1991 12:00:00 AM
Abstract :
Some of the evidence for the effect of Cr orientation on the crystallographic orientation of Co-based thin films is presented. The authors review four experimental techniques that can be used to investigate the orientation relationships (OR) between the magnetic Co-based film and the Cr underlayer. These techniques are X-ray diffraction, selected area (electron) diffraction (SAD), electron microdiffraction, and atomic resolution electron microscopy of cross sections of the bi-layer films. The authors focus on the crystallographic orientation relationships between the grains in the magnetic film and those in the Cr (BCC) underlayer. The magnetic films discussed are all alloys of Co, usually with HCP structure
Keywords :
X-ray diffraction examination of materials; chromium alloys; cobalt alloys; crystal orientation; electron diffraction examination of materials; electron microscope examination of materials; ferromagnetic properties of substances; magnetic recording; magnetic thin films; nickel alloys; surface texture; BCC underlayer; CoNiCr-Cr; Cr orientation; Cr underlayers; HCP structure; X-ray diffraction; atomic resolution electron microscopy; bilayer films; crystallographic orientation; electron microdiffraction; hard disk; magnetic film; magnetic recording; selected area electron diffraction; texture; Chromium alloys; Cobalt alloys; Crystallography; Electrons; Magnetic films; Magnetic recording; Materials science and technology; Sputtering; Transistors; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
