DocumentCode
1063055
Title
A cross-section TEM study of the microstructural evolution of CoPtCr/Cr thin films and the effect on magnetic properties
Author
Parker, M.A. ; Johnson, K.E. ; Hwang, C. ; Bermea, A.
Author_Institution
IBM Storage Syst. Products Div., San Jose, CA, USA
Volume
27
Issue
6
fYear
1991
fDate
11/1/1991 12:00:00 AM
Firstpage
4730
Lastpage
4732
Abstract
The authors study the mechanism underlying the dependence of magnetic properties on Cr underlayer thickness in the CoPtCr/Cr system. A novel procedure was utilized to prepare cross-section transmission electron microscopy (TEM) specimens from actual recording disks to examine the influence of grain size, grain boundary morphology, crystallographic texture, and interfacial structure on the magnetic properties. The changes in crystallographic texture were followed by elongated probe micro-diffraction (EPMD) and selected area diffraction (SAD). Magnetic properties can be explained as a result of the lessened in-plane c-axis orientation, larger grain size, and wider intergranular separation
Keywords
chromium; chromium alloys; cobalt alloys; ferromagnetic properties of substances; grain boundaries; grain size; interface structure; magnetic recording; magnetic thin films; platinum alloys; sputtered coatings; transmission electron microscope examination of materials; CoPtCr-Cr thin films; EPMD; cross-section TEM; cross-section transmission electron microscopy; crystallographic texture; elongated probe micro-diffraction; grain boundary morphology; grain size; in-plane c-axis orientation; interfacial structure; intergranular separation; magnetic properties; microstructural evolution; recording disks; selected area diffraction; Chromium; Crystallography; Disk recording; Grain boundaries; Grain size; Magnetic force microscopy; Magnetic properties; Magnetic recording; Morphology; Transmission electron microscopy;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.278929
Filename
278929
Link To Document