DocumentCode :
1063189
Title :
Acoustic Microscopy Technique to Precisely Locate Layer Delamination
Author :
Rupitsch, Stefan J. ; Zagar, Bernhard G.
Author_Institution :
Johannes Kepler Univ. Linz, Linz
Volume :
56
Issue :
4
fYear :
2007
Firstpage :
1429
Lastpage :
1434
Abstract :
In this paper, the synthetic aperture focusing technique (SAFT) is applied to extend the depth of focus for spherically focused ultrasound transducers. This technique uses a virtual source element in the geometrical focus of the transducer. Initial experiments with a 90-mum copper wire are conducted to investigate the efficacy of SAFT processing for positive and negative defocus. Furthermore, delamination of two glued together transparent Perspex plates is investigated. Compared to the common B-mode ultrasonic imaging that can only detect the presence of layer delamination, the proposed SAFT can accurately locate the position of delamination and visualize its extension.
Keywords :
acoustic microscopy; ultrasonic focusing; ultrasonic transducers; SAFT; acoustic microscopy technique; negative defocus; positive defocus; precisely locate layer delamination; synthetic aperture focusing technique; ultrasound transducers; Acoustic transducers; Copper; Delamination; Focusing; Materials testing; Microscopy; Time domain analysis; Ultrasonic imaging; Ultrasonic transducers; Wire; B-mode imaging; delamination; synthetic aperture focusing technique (SAFT); ultrasound imaging; virtual source;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2007.899866
Filename :
4277046
Link To Document :
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