• DocumentCode
    1063189
  • Title

    Acoustic Microscopy Technique to Precisely Locate Layer Delamination

  • Author

    Rupitsch, Stefan J. ; Zagar, Bernhard G.

  • Author_Institution
    Johannes Kepler Univ. Linz, Linz
  • Volume
    56
  • Issue
    4
  • fYear
    2007
  • Firstpage
    1429
  • Lastpage
    1434
  • Abstract
    In this paper, the synthetic aperture focusing technique (SAFT) is applied to extend the depth of focus for spherically focused ultrasound transducers. This technique uses a virtual source element in the geometrical focus of the transducer. Initial experiments with a 90-mum copper wire are conducted to investigate the efficacy of SAFT processing for positive and negative defocus. Furthermore, delamination of two glued together transparent Perspex plates is investigated. Compared to the common B-mode ultrasonic imaging that can only detect the presence of layer delamination, the proposed SAFT can accurately locate the position of delamination and visualize its extension.
  • Keywords
    acoustic microscopy; ultrasonic focusing; ultrasonic transducers; SAFT; acoustic microscopy technique; negative defocus; positive defocus; precisely locate layer delamination; synthetic aperture focusing technique; ultrasound transducers; Acoustic transducers; Copper; Delamination; Focusing; Materials testing; Microscopy; Time domain analysis; Ultrasonic imaging; Ultrasonic transducers; Wire; B-mode imaging; delamination; synthetic aperture focusing technique (SAFT); ultrasound imaging; virtual source;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2007.899866
  • Filename
    4277046