Title :
Overwrite-induced bit shift in digital magnetic recording systems
Author_Institution :
Toshiba Res. & Dev. Center, Kawasaki, Japan
fDate :
11/1/1991 12:00:00 AM
Abstract :
A method to estimate overwrite-induced bit shift (OWIBS) with window margin measurements is provided. Experimental results indicated that, contrary to the conventional method, overwrite modulation (OWM) should be measured on a low-frequency signal. OWIBS in longitudinal thin-film media is mostly caused by a hard transition bit shift. OWIBS can be estimated roughly, using signal spectra written after DC-erasure
Keywords :
codes; hard discs; magnetic recording; modulation; signal processing; digital magnetic recording systems; hard transition bit shift; longitudinal thin-film media; low-frequency signal; overwrite modulation; overwrite-induced bit shift; rigid disc; window margin measurements; Circuit noise; Digital magnetic recording; Frequency estimation; Frequency measurement; Hafnium; Low-frequency noise; Magnetic heads; Noise level; Testing; Time measurement;
Journal_Title :
Magnetics, IEEE Transactions on
