• DocumentCode
    1063540
  • Title

    The high field, high frequency permeability of narrow, thin-film magnetic stripes

  • Author

    Webb, Bucknell C. ; Re, Mark E. ; Jahnes, Christopher V. ; Russak, Michael A.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    27
  • Issue
    6
  • fYear
    1991
  • fDate
    11/1/1991 12:00:00 AM
  • Firstpage
    4876
  • Lastpage
    4878
  • Abstract
    The authors report measurements of the magnetic response of arrays of narrow Permalloy stripes using a high field permeameter. The permeameter operates in a swept frequency mode from 300 KHz to 30 MHz with a field amplitude of up to 5 Oe. Using this device, two modes of flux conduction, rotation and wall motion, can be observed in narrow Permalloy stripes. The low field-amplitude permeability of narrow unlaminated Permalloy stripes is frequency independent except for eddy current losses as expected for magnetization rotation. At higher fields the magnetic response increases at frequencies below 10 MHz with increasing drive amplitude as domain wall motion becomes significant. Results are consistent with the expected domain wall mobility (around 2×103 cm/(s-Oe) for 2-μm-thick films). Because of the high density of wall in microscopic structures, wall motion is the dominant flux conduction mechanism below 30 MHz at high drive fields
  • Keywords
    Permalloy; ferromagnetic properties of substances; magnetic domain walls; magnetic heads; magnetic permeability; magnetic thin films; 300 KHz to 30 MHz; eddy current losses; high field permeameter; high frequency permeability; magnetic heads; magnetic response; modes of flux conduction; narrow Permalloy stripes; rotation; stripe arrays; swept frequency mode; thin-film magnetic stripes; wall motion; Eddy currents; Frequency; Magnetic domain walls; Magnetic domains; Magnetic field measurement; Magnetic films; Magnetic flux; Magnetization; Permeability; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.278976
  • Filename
    278976