DocumentCode
1063542
Title
A 7000-gate microprocessor on SOS—PULCE
Author
Isobe, Mitsuo ; Iwamura, Jun ; Ohhashi, Masahide ; Koike, Hideharu ; Maeguchi, Kenji ; Sato, Tai ; Tango, Hiroyuki
Author_Institution
Toshiba Corporation, Ltd., Kawasaki, Japan
Volume
26
Issue
4
fYear
1979
fDate
4/1/1979 12:00:00 AM
Firstpage
588
Lastpage
595
Abstract
An n-channel MOS LSI microprocessor integrating 20 000 transistors on a chip has been realized on a sapphire substrate utilizing the Coplanar-II process. It contains ALU, shifters, and 44 registers which are combined to three 16-bit buses. By utilizing three types of threshold voltage for load transistors, 28-percent reduction in power dissipation is achieved. The minimum cycle time is 200 ns. By using the Coplanar-II process, anomalous leakage currents due to parasitic transistors at the sides of island are suppressed. It is found that the silicon-on-sapphire (SOS) version operates 2.3 times faster than the bulk-silicon version, which is mainly explained by the parasitic capacitance ratio. Parallel-plate approximation in calculating a wiring capacitance results in an underestimate by a factor of 60 compared with taking the two-dimensional effect into account. It is verified that a) the observed yield of a very large SOS chip is higher than the value predicted from a randomly distributed defects model, and b) the yield-sensitive active area of an SOS is so small that it can compensate for the yield degradation due to the very large defects density on an SOS wafer.
Keywords
Large scale integration; Leakage current; MOSFETs; Microprocessors; Parasitic capacitance; Power dissipation; Registers; Semiconductor device modeling; Threshold voltage; Wiring;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1979.19464
Filename
1480042
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