DocumentCode :
1064141
Title :
3-D electronics interconnect for high-performance imaging detectors
Author :
Kwiatkowski, Kris ; Lyke, Jim ; Wojnarowski, Robert ; Kapusta, Chris ; Kleinfelder, Stuart ; Wilke, Mark
Author_Institution :
Phys. Div., Los Alamos Nat. Lab., NM, USA
Volume :
51
Issue :
4
fYear :
2004
Firstpage :
1829
Lastpage :
1834
Abstract :
We describe work that extends three-dimensional (3-D) patterned overlay high-density interconnect (HDI) to high-performance imaging applications. The work was motivated by the rigorous requirements of the multiple-pulse imager for dynamic proton radiography. The optical imager has to provide large (>90%) optical fill factor, high quantum efficiency, 200-ns inter-frame time interval, and storage for >32 frames. In order to accommodate the massively parallel electronics including the signal storage for a large number of frames, it is necessary to provide novel 3-D interconnect and packaging architectures. Recently, a 3-D interconnect technology was successfully demonstrated to assemble a stack of 50 signal-processing chips into a cube. Each chip contained test connections (interconnect continuity only) simulating 160 channels of pixel read-out electronics. Test cube assemblies, based on these mock-up integrated circuits, have been fabricated to explore the feasibility of constructing functional cube arrays. A novel 3-D integrated sensor-electronics (mirror-cube) imager architecture is proposed. We also briefly review progress in the custom fast image-processing electronics.
Keywords :
image processing; integrated circuits; nuclear electronics; parallel processing; position sensitive particle detectors; proton effects; radiography; readout electronics; reviews; 3-D electronics interconnect technology; 3-D integrated sensor-electronics imager architecture; 3-D patterned overlay high-density interconnect; HDI; adaptive lithography; die stacking; dynamic proton radiography; fast image-processing electronics; functional cube arrays; high quantum efficiency; high-performance imaging detector; interconnect continuity; interframe time interval; massively parallel electronics; mirror imaging cube; mock-up integrated circuits; multiple-pulse imager; optical fill factor; optical imager; packaging architecture; pixel read-out electronics; polymer bump bonding; review; signal storage; signal-processing chips; test cube assembly; Assembly; Circuit testing; Detectors; Electronic equipment testing; Image storage; Integrated circuit interconnections; Optical imaging; Optical interconnections; Optical sensors; Protons;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2004.832712
Filename :
1323776
Link To Document :
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