DocumentCode :
1064324
Title :
Counting Rates Modeling for PET Scanners With GATE
Author :
Guez, David ; Bataille, Frédéric ; Comtat, Claude ; Honoré, Pierre-Francois ; Jan, Sébastien ; Kerhoas, Sophie
Author_Institution :
CEA/DSM/DAPNIA/SPHN, Gif-sur-Yvette
Volume :
55
Issue :
1
fYear :
2008
Firstpage :
516
Lastpage :
523
Abstract :
Several developments were made in the GATE simulation platform to allow accurate modeling of the count rate performances of PET scanners over a wide range of activity concentrations. A background noise module, a dead time and limited bandwidth modeling for the coincidences, and a delayed coincidence builder were added in the code. The results obtained for the modeling of the ECAT HRRT and Focus 220 scanners with the newly developed modules are discussed. They show that GATE can be used to accurately simulate the single event, prompt coincidence and delayed coincidence rates, from very low activity levels in the field of view up to levels that saturate the acquisition system. The new developments were committed into the public release of GATE, making them available for the whole community, thanks to the open source license under which GATE is published (LGPL).
Keywords :
Monte Carlo methods; positron emission tomography; ECAT HRRT scanner; Focus 220 scanner; GATE simulation platform; PET scanners; counting rates modeling; Background noise; Bandwidth; Delay effects; Detectors; Discrete event simulation; Event detection; Focusing; Image quality; Licenses; Positron emission tomography; Bandwidth; GATE; Geant4; Monte Carlo simulation; dead time; memory buffer; positron emission tomography;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2007.910880
Filename :
4448488
Link To Document :
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