Title :
Measurement techniques for monolithic microwave integrated circuits
Author :
Lucyszyn, S. ; Stewart, C. ; Robertson, I.D. ; Aghvami, A.H.
Author_Institution :
Dept. of Electron. & Electr. Eng., King´´s Coll., London, UK
fDate :
4/1/1994 12:00:00 AM
Abstract :
Introduces the basic technologies that are associated with measurements of monolithic microwave integrated circuits. The use of test fixtures and wafer probe stations at ambient room temperature is reviewed and their role at thermal and cryogenic temperatures is discussed. With the increasing need for performing non-invasive measurements, advances in experimental field probing techniques are explored
Keywords :
MMIC; calibration; high-temperature techniques; integrated circuit testing; low-temperature techniques; microwave measurement; test equipment; ambient room temperature; cryogenic temperatures; experimental field probing techniques; monolithic microwave integrated circuits; noninvasive measurements; test fixtures; thermal temperature; wafer probe stations;
Journal_Title :
Electronics & Communication Engineering Journal
DOI :
10.1049/ecej:19940204
