DocumentCode :
1064967
Title :
Substrate current in GaAs MESFET´s
Author :
Eastman, L.F. ; Shur, M.S.
Author_Institution :
Cornell University, Ithaca, NY
Volume :
26
Issue :
9
fYear :
1979
fDate :
9/1/1979 12:00:00 AM
Firstpage :
1359
Lastpage :
1361
Abstract :
It is shown that the substrate current in GaAs MESFET\´s may be related to the electron injection into the substrate region adjacent to the high-field domain in the active layer. A simple one-dimensional calculation shows that the substrate current Isubis proportional to V\\min{ds}\\max {1/2} and n\\min{0}\\max {1/4} where Vdsis the drain-to-source voltage, n0is the doping density in the active layer. At n_{0} = 10^{17} cm-3and V_{ds} \\simeq 10 V we estimate I_{sub} \\sim 50 mA per millimeter gate in good agreement with experimental results.
Keywords :
Computer simulation; Current density; Doping; Electrons; Electrostatics; FETs; Gallium arsenide; MESFETs; Poisson equations; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1979.19606
Filename :
1480184
Link To Document :
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