Title :
Niobium and Tantalum High Q Resonators for Photon Detectors
Author :
Barends, R. ; Baselmans, J.J.A. ; Hovenier, J.N. ; Gao, J.R. ; Yates, S.J.C. ; Klapwijk, T.M. ; Hoevers, H.F.C.
Author_Institution :
Delft Univ. of Technol., Delft
fDate :
6/1/2007 12:00:00 AM
Abstract :
We have measured the quality factors and phase noise of niobium and tantalum coplanar waveguide microwave resonators on silicon. The results of both materials are similar. We reach quality factors up to 105. At low temperatures the quality factors show an anomalous increase, while the resonance frequency remains constant for increasing power levels. The resonance frequency starts to decrease at temperatures around a tenth of the critical temperature. The phase noise exhibits a 1/f like slope. We attribute this behavior to the silicon dielectric.
Keywords :
Q-factor; dielectric losses; niobium; phase noise; superconducting photodetectors; superconducting resonators; tantalum; Nb - Interface; Ta - Interface; critical temperature; dielectric losses; niobium phase noise; photon detectors; power levels; quality factors; resonance frequency; silicon dielectric; superconducting resonators; tantalum coplanar waveguide microwave resonators; tantalum high Q resonators; Detectors; Microwave measurements; Niobium; Noise measurement; Phase noise; Q factor; Resonance; Resonant frequency; Silicon; Temperature; Dielectric losses; kinetic inductance; photon detection; superconducting resonators;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2007.898541
