DocumentCode :
1065155
Title :
Storage loop definition for Bloch line memories
Author :
Boileau, F. ; Arnaud, Laurent ; Thiaville, Andre ; Vabre, M. ; Fontanet, E.
Author_Institution :
CEA/IRDI/BP, Grenoble, France
Volume :
24
Issue :
2
fYear :
1988
fDate :
3/1/1988 12:00:00 AM
Firstpage :
1719
Lastpage :
1721
Abstract :
A technique is presented to delineate correctly the position of the storage loops, i.e. domain walls where the Bloch line pairs have to sit for the operation of the memory. To make the loop confinement technique feasible over a wide range of material parameters, bias field values, and technological parameters, a grooving technique is chosen. A model is first described and various stability conditions are studied. Experimental realization of that technique is then presented and illustrated, and the confinement conditions are compared with the predictions of the model.
Keywords :
magnetic storage; Bloch line memories; bias field values; confinement conditions; domain walls; grooving technique; loop confinement technique; material parameters; stability conditions; storage loops; technological parameters; Garnets; Magnetic confinement; Magnetic domain walls; Magnetic domains; Magnetic materials; Magnetic separation; Potential well; Predictive models; Solid state circuits; Stability;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.11581
Filename :
11581
Link To Document :
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