Complete characterization studies provide verification of RBDT(RSR) reliability

This paper presents the latest characterization information available for a two-terminal, high-speed, solid-state switch previously called the RSR (Reverse Switching Rectifier) but presently referred to as the RBDT (Reverse Blocking Diode Thyristor). Studies of the RBDT have been continuing, leading to broader pulse loss characterization than had previously been available. Loss characterization and trigger studies were made concurrently, and the results show that with proper triggering, the RBDT will function reliably and with minimum loss. New test equipment, which tests to customer specified load conditions is described. The paper concludes with a summary of field originated life data, which supports the conclusion that the RBDT may be effectively and reliably applied for short-pulse, high-current, high rate-of-rise duty.