DocumentCode :
1065387
Title :
Novel Local Silicon-Gate Carbon Nanotube Transistors Combining Silicon-on-Insulator Technology for Integration
Author :
Zhang, Min ; Chan, Philip C.H. ; Chai, Yang ; Liang, Qi ; Tang, Z.K.
Author_Institution :
Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon
Volume :
8
Issue :
2
fYear :
2009
fDate :
3/1/2009 12:00:00 AM
Firstpage :
260
Lastpage :
268
Abstract :
By taking advantage of the silicon-on-insulator technology and the in situ carbon nanotube (CNT) growth, new local silicon-gate carbon nanotube FETs (CNFETs) have been implemented in this paper. We propose an approach to integrate the CNFET onto the silicon CMOS platform for the first time. Individual device operation, batch fabrication, low parasitic capacitance, and better compatibility to the CMOS process were realized. The characteristics of the CNFETs are comparable to the state-of-the-art devices reported. The scaling effect, ambipolar conductance, Schottky barrier effect, and I-V characteristics noise were analyzed. The physical properties of the CNTs were also characterized.
Keywords :
CMOS integrated circuits; Schottky barriers; carbon nanotubes; field effect transistors; silicon-on-insulator; CMOS platform; CNFET; Schottky barrier; Si-C; ambipolar conductance; scaling effect; silicon-gate carbon nanotube FET; silicon-on-insulator technology; Carbon nanotube (CNT); carbon nanotube FET (CNFET); integration; nanotechnology; silicon-on-insulator (SOI);
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2008.2011773
Filename :
4749330
Link To Document :
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