DocumentCode :
1065394
Title :
Fabrication and Electrical Characterization of Densified Carbon Nanotube Micropillars for IC Interconnection
Author :
Liu, Zhengchun ; Ci, Lijie ; Kar, Swastik ; Ajayan, Pulickel M. ; Lu, Jian-Qiang
Author_Institution :
Center for Integrated Electron., Rensselaer Polytech. Inst., Troy, NY
Volume :
8
Issue :
2
fYear :
2009
fDate :
3/1/2009 12:00:00 AM
Firstpage :
196
Lastpage :
203
Abstract :
Closely packed carbon nanotube (CNT) bundles are expected to have higher conductivity than copper and could potentially replace copper for electrical and thermal conductors in IC chips. However, it is extremely difficult, if not impossible, to controllably grow closely packed CNT bundles. We report on a novel postgrowth capillary densification method, which results in dramatic increase of CNT site density. Bare CNT pillars are densified approximately 15 times. High-density CNT micropillars and micrologs with round cross sections were fabricated from CNTs coated with parylene prior to densification. These CNT micropillars and micrologs could be used as basic building blocks for future IC interconnection. Electrical characterization results show that the densification process does not mitigate the electrical conducting performance of CNTs.
Keywords :
carbon nanotubes; conductors (electric); densification; electrical conductivity; integrated circuit interconnections; C; CNT bundles; IC chips; IC interconnection; copper; densified carbon nanotube micropillar fabrication; electrical conductivity; electrical conductors; postgrowth capillary densification method; thermal conductors; Carbon nanotube (CNT); IC interconnection; densification; resistance;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2008.2011774
Filename :
4749331
Link To Document :
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