DocumentCode :
1065539
Title :
Fundamental Interpretation of the Salt Effects on Limiting Flashover Voltages of the Salt-Contaminated SiO2 Plates in Terms of Solid-State Electrochemistry
Author :
Vijh, Ashok K.
Author_Institution :
Hydro-Quebec Institute of Research, Varennes, P.Q., Canada
Issue :
2
fYear :
1976
fDate :
6/1/1976 12:00:00 AM
Firstpage :
59
Lastpage :
62
Abstract :
The interpretation of the limiting flashover voltages (LFOV) observed on SiO2 insulator plates contaminated by nine common salts (NaCl, NaNO3, Na2SO4, MgCl2, Mg(NO3)2, MgSO4, CaCI2, Ca(NO3)2 and CaSO4) has been carried out in terms of the concepts of solid-state electrochemistry. On the basis of the hypothesis that the salt under the active electrode is dry during flashover, it has been shown that the LFOV values for various salts are roughly related to their heats of formation per equivalent and bandgap values. The alternative hypothesis that the salt under the active electrode is wet has also been examined and the possibility of interpreting the salt effects on LFOV values in the context of this hypothesis has been explored.
Keywords :
Conducting materials; Dielectrics and electrical insulation; Electrical equipment industry; Electrodes; Electronics industry; Flashover; Industrial electronics; Photonic band gap; Solid state circuits; Voltage;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/TEI.1976.297951
Filename :
4080338
Link To Document :
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