• DocumentCode
    1065808
  • Title

    An Optimum Design Methodology for Planar-Type Coaxial Probes Applicable to Broad Temperature Permittivity Measurements

  • Author

    Kim, Namgon ; Yoon, Jeonghoon ; Cho, Sungjoon ; Cho, Jeiwon ; Cheon, Changyul ; Kwon, Youngwoo

  • Author_Institution
    Seoul Nat. Univ., Seoul
  • Volume
    56
  • Issue
    3
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    684
  • Lastpage
    692
  • Abstract
    A planar-type coaxial probe applicable to wide temperature and frequency range has been developed. The probe employs a dielectric with a low coefficient of thermal expansion to minimize the effect of thermal deformation for broad temperature measurements. Additionally, a detailed design methodology has been developed to optimize the probe apertures in an effort to minimize the measurement uncertainty while maximizing the operating bandwidth. For this purpose, thorough sensitivity analysis has been employed to correlate the probe structures and dimensions to the individual sensitivity parameters. The analysis has been validated by parametric experiments. By using the dielectric with a low coefficient of thermal expansion and optimizing the probe dimensions, accurate permittivity measurements have been demonstrated from 30 C to 75 C with 40-GHz bandwidth. With the application of the error-correction method, the measurement temperature range has been further extended all the way up to the boiling temperature of water C). Furthermore, the complex permittivities of methanol have been measured from 30 C to 50 C and the dispersion parameters and full interpolation formulas have been extracted.
  • Keywords
    error correction; measurement uncertainty; permittivity measurement; thermal expansion; thermal variables measurement; bandwidth 40 GHz; coefficient of thermal expansion; error correction method; measurement uncertainty; optimum design methodology; planar type coaxial probes; sensitivity analysis; temperature 30 degC to 75 degC; temperature measurements; temperature permittivity measurements; thermal deformation; Coaxial aperture; complex permittivity; planar-type probe; thermal deformation; wide temperature;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2008.916986
  • Filename
    4449065