DocumentCode :
1065842
Title :
Transient refractive index measurements in XeF laser gas mixtures
Author :
Fulghum, Stephen F. ; Trainor, Daniel W. ; Appel, Craig H.
Author_Institution :
Avco Res. Lab., Everett, MA, USA
Volume :
25
Issue :
5
fYear :
1989
fDate :
5/1/1989 12:00:00 AM
Firstpage :
955
Lastpage :
962
Abstract :
Transient refractive index (TRI) measurements made in e-beam-pumped XeF laser gas mixtures as a function of energy loading are discussed. Both NF3 and F2 were used as halogen donors in a neon base. TRI due to halogen donor burnup and to plasma dispersion was measured at 578.4 nm in typical laser mixtures containing Xe and at 353.2 nm in mixtures without Xe. The net index of refraction of the mixtures decreased with increasing energy loading, resulting in a difference of about 50×10-9 to 100×10-9 between pumped and unpumped region at a typical loading of 150 J/1.
Keywords :
electron beam effects; excimer lasers; gas mixtures; refractive index measurement; xenon compounds; 353.2 nm; 578.4 nm; F2; NF3; Ne2; XeF laser; e-beam-pumped; energy loading; gas mixtures; halogen donor burnup; halogen donors; net index of refraction; plasma dispersion; pumped region; transient refractive index measurements; unpumped region; Acoustic beams; Dispersion; Gas lasers; Kinetic theory; Laboratories; Laser beams; Laser excitation; Plasma measurements; Pump lasers; Refractive index;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.27986
Filename :
27986
Link To Document :
بازگشت