Title :
MP-A8 Two-dimensional numerical simulation of GaAs MESFET´s with recessed-gate structure
fDate :
11/1/1979 12:00:00 AM
Keywords :
Breakdown voltage; Gallium arsenide; Geometry; Instruments; Laboratories; MESFETs; Numerical simulation; Power generation; Semiconductor process modeling; Surface treatment;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1979.19702