Title : 
MP-A8 Two-dimensional numerical simulation of GaAs MESFET´s with recessed-gate structure
         
        
        
        
        
        
            fDate : 
11/1/1979 12:00:00 AM
         
        
        
        
            Keywords : 
Breakdown voltage; Gallium arsenide; Geometry; Instruments; Laboratories; MESFETs; Numerical simulation; Power generation; Semiconductor process modeling; Surface treatment;
         
        
        
            Journal_Title : 
Electron Devices, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/T-ED.1979.19702