• DocumentCode
    1066174
  • Title

    Performance limits of electrical interconnections to a high-speed chip

  • Author

    Rainal, Attilio J.

  • Author_Institution
    AT&T Bell Lab., Whippany, NJ, USA
  • Volume
    11
  • Issue
    3
  • fYear
    1988
  • fDate
    9/1/1988 12:00:00 AM
  • Firstpage
    260
  • Lastpage
    266
  • Abstract
    An electrical model to characterize the transmission path from a printed wiring board to a high-speed chip is proposed. The model accounts for the important constraint of inductive noise. The parameter values of the transmission path depend on the physical design of the electrical interconnections. For various input signal rise times (i.e., 0.1 ns), the following results are presented: the reflected waveform, the energy of the reflected waveform, and the waveform received at the chip. These results lead to definite performance limits (e.g., bit rate) for the electrical interconnections from a printed wiring board to a high-speed chip. For advanced physical designs, tolerable pulse-waveform degradation occurs for bit rates of a few Gb/s. However, for much higher bit rates, serious pulse degradation can occur. The model can also be used to analyze high-speed connectors and general chip packages
  • Keywords
    circuit layout; printed circuits; transmission lines; electrical interconnections; high-speed chip; inductive noise; performance limits; printed wiring board; pulse degradation; pulse-waveform degradation; reflected waveform; transmission path; Connectors; Degradation; Inductance; Integrated circuit interconnections; Noise level; Packaging; Power system interconnection; Switches; Transmission line discontinuities; Wiring;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.16650
  • Filename
    16650