• DocumentCode
    1066221
  • Title

    Stability of traveling-wave amplifiers with reflections

  • Author

    Antonsen, Thomas M., Jr. ; Safier, Pedro ; Chernin, David P. ; Levush, Baruch

  • Author_Institution
    Sci. Applications Int. Corp., McLean, VA, USA
  • Volume
    30
  • Issue
    3
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Firstpage
    1089
  • Lastpage
    1107
  • Abstract
    The maximum achievable gain in individual sections of helix-type traveling-wave amplifiers is limited by the requirement that the device be stable with respect to the excitation of spurious modes. The excited modes may be of two types: backward waves, which are absolutely unstable, or forward waves, which are unstable in the presence of reflections and regenerative amplification. Whether a specific device is unstable depends on a number of details that must be computed numerically. We will present a model, used in the traveling-wave tube simulation code CHRISTINE, in which stability is determined including a number of important effects. These are: the placement of severs, their reflection and transmission coefficients, the profile of attenuation along the interaction length, the presence of a driven signal, and the coupling of forward and backward waves due to asymmetries in the helix support structure. Asymmetries result in a stopband near the "π" point formed by the coupling of the forward and backward waves. For this case, a model is developed to evaluate the maximum stable length.
  • Keywords
    digital simulation; stability; travelling wave amplifiers; travelling wave tubes; CHRISTINE traveling-wave tube simulation code; absolutely unstable modes; asymmetries; attenuation; backward waves; device stability; excited modes; forward waves; helix-type traveling-wave amplifiers; maximum stable length model; reflection coefficients; reflections; regenerative amplification; stopband; transmission coefficients; Attenuation; Books; Computational modeling; Couplings; Feedback; Frequency; Optical reflection; Oscillators; Process design; Stability analysis;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2002.801563
  • Filename
    1158344