Title :
TP-A5 a simple contactless microwave method for measuring carrier lifetime during solar-cell fabrication
Author :
Chappell, T.I. ; White, Richard M. ; Bernstein, J.
fDate :
11/1/1979 12:00:00 AM
Keywords :
Charge carrier lifetime; Computer simulation; Fabrication; Microwave measurements; Microwave theory and techniques; Oxidation; Photovoltaic cells; Semiconductor diodes; Silicon; Substrates;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1979.19731
