• DocumentCode
    1066266
  • Title

    TP-A4 C-V profiling through n-n heterojunctions

  • Author

    Kroemer, H.

  • Volume
    26
  • Issue
    11
  • fYear
    1979
  • fDate
    11/1/1979 12:00:00 AM
  • Firstpage
    1839
  • Lastpage
    1839
  • Keywords
    Capacitance-voltage characteristics; Electrons; Heterojunctions; Microwave theory and techniques; Monitoring; Oxidation; P-n junctions; Photovoltaic cells; Schottky barriers; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1979.19732
  • Filename
    1480310