DocumentCode
1066302
Title
An Analog Circuit for Accurate OCVD Measurements
Author
Bellone, Salvatore ; Licciardo, Gian Domenico
Author_Institution
Dept. of Inf. & Electr. Eng., Univ. of Salerno, Salerno
Volume
57
Issue
6
fYear
2008
fDate
6/1/2008 12:00:00 AM
Firstpage
1112
Lastpage
1117
Abstract
An electronic circuit for making accurate open-circuit voltage decay measurements is presented. The circuit overcomes the main limitations that occur in the standard method when used for carrier lifetime characterization because it realizes the ldquoopen-circuit conditionsrdquo of the device under test with an impedance higher than 100 MOmega and reduces the noise that is inherent in the differential operation of the method.
Keywords
analogue circuits; carrier lifetime; semiconductor device measurement; voltage measurement; OCVD measurement; analog circuit; carrier lifetime characterization; device under test; open-circuit voltage decay measurements; Differentiator; lifetime; measurement setup; open-circuit voltage decay (OCVD); signal-to-noise ratio (SNR);
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2007.915468
Filename
4450600
Link To Document