• DocumentCode
    1066409
  • Title

    Prognostic and Warning System for Power-Electronic Modules in Electric, Hybrid Electric, and Fuel-Cell Vehicles

  • Author

    Xiong, Yali ; Cheng, Xu ; Shen, Z. John ; Mi, Chunting ; Wu, Hongjie ; Garg, Vijay K.

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Central Florida Univ., Orlando, FL
  • Volume
    55
  • Issue
    6
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    2268
  • Lastpage
    2276
  • Abstract
    Reliability of power-electronic modules is of paramount importance for the commercial success of various types of electric vehicles. In this paper, we study the technical feasibility of detecting and utilizing early symptoms and warning signs of power-module degradation due to thermomechanical stress and fatigue and develop a prognostic system that can monitor the state of health of the power modules in electric, hybrid, and fuel-cell vehicles. A special degradation trace on the VCEsat of the insulated-gate bipolar-transistor modules was observed by a power-cycling accelerated test, which was not reported in literatures. A prognostic system based on utilizing the aforementioned trace is then developed. The system consists of the hardware architecture and current adaptive-algorithm-based software architecture. In addition, this prognostic system hardly increases the hardware cost on existing vehicle-driver system. An extensive simulation based on MATLAB/Simulink verifies the developed prognostic system.
  • Keywords
    electric vehicles; fuel cell vehicles; hybrid electric vehicles; insulated gate bipolar transistors; power electronics; electric vehicles; fuel-cell vehicles; hybrid electric vehicles; insulated-gate bipolar-transistor modules; power-cycling accelerated test; power-electronic modules; power-module degradation; prognostic system; thermomechanical stress; warning system; Electric vehicles; electric vehicles; electronics module; hybrid vehicles; reliability;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2008.918399
  • Filename
    4450612