DocumentCode :
1066453
Title :
Simulation of microwave devices with external cavities using MAGY
Author :
Vlasov, Alexander N. ; Antonsen, Thomas M., Jr. ; Chernin, David P. ; Levush, Baruch ; Wright, Edward L.
Author_Institution :
Sci. Applications Int. Corp., McLean, VA, USA
Volume :
30
Issue :
3
fYear :
2002
fDate :
6/1/2002 12:00:00 AM
Firstpage :
1277
Lastpage :
1291
Abstract :
A self-consistent large-signal beam-field interaction model for vacuum electronic microwave sources with external cavities is described. The model includes a self-consistent solution of the three-dimensional equations of electron motion and the time-dependent field equations. The RF fields are decomposed into the fields inside the beam region and the fields inside outer resonators. The RF fields inside the beam region are represented as a superposition of local waveguide modes. The RF fields inside resonators are represented as a sum over resonator modes. The various modes are coupled together due to gaps connecting cavities with each other and with the beam region. The numerical implementation of the model requires additional analytical steps to obtain an effective, convergent, and stable numerical solution. The modified version of the code MAGY has been tested by a comparison with known results and also with measured data.
Keywords :
cavity resonators; klystrons; microwave tubes; vacuum microelectronics; MAGY; RF fields; analytical steps; cavity resonators; electron motion; external cavities; klystrons; large signal models; local waveguide modes; microwave devices; numerical solution; resonators; self-consistent large-signal beam-field interaction model; simulation; sum over resonator modes; three-dimensional equations; time-dependent field equations; vacuum electronic devices; vacuum electronic microwave sources; Coupling circuits; Electromagnetic waveguides; Electron beams; Equations; Klystrons; Laboratories; Microwave devices; Object oriented modeling; Optical coupling; Radio frequency;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2002.801600
Filename :
1158366
Link To Document :
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