DocumentCode
1066453
Title
Simulation of microwave devices with external cavities using MAGY
Author
Vlasov, Alexander N. ; Antonsen, Thomas M., Jr. ; Chernin, David P. ; Levush, Baruch ; Wright, Edward L.
Author_Institution
Sci. Applications Int. Corp., McLean, VA, USA
Volume
30
Issue
3
fYear
2002
fDate
6/1/2002 12:00:00 AM
Firstpage
1277
Lastpage
1291
Abstract
A self-consistent large-signal beam-field interaction model for vacuum electronic microwave sources with external cavities is described. The model includes a self-consistent solution of the three-dimensional equations of electron motion and the time-dependent field equations. The RF fields are decomposed into the fields inside the beam region and the fields inside outer resonators. The RF fields inside the beam region are represented as a superposition of local waveguide modes. The RF fields inside resonators are represented as a sum over resonator modes. The various modes are coupled together due to gaps connecting cavities with each other and with the beam region. The numerical implementation of the model requires additional analytical steps to obtain an effective, convergent, and stable numerical solution. The modified version of the code MAGY has been tested by a comparison with known results and also with measured data.
Keywords
cavity resonators; klystrons; microwave tubes; vacuum microelectronics; MAGY; RF fields; analytical steps; cavity resonators; electron motion; external cavities; klystrons; large signal models; local waveguide modes; microwave devices; numerical solution; resonators; self-consistent large-signal beam-field interaction model; simulation; sum over resonator modes; three-dimensional equations; time-dependent field equations; vacuum electronic devices; vacuum electronic microwave sources; Coupling circuits; Electromagnetic waveguides; Electron beams; Equations; Klystrons; Laboratories; Microwave devices; Object oriented modeling; Optical coupling; Radio frequency;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2002.801600
Filename
1158366
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