DocumentCode

1066470

Title

TP-C14 ionization coefficients of electrons and holes in InP

Author

Armiento, C.A. ; Groves, S.H. ; Hurwitz, C.E.

Volume

26

Issue

11

fYear

1979

fDate

11/1/1979 12:00:00 AM

Firstpage

1846

Lastpage

1846

Keywords

Charge carrier processes; Diodes; Electric breakdown; Etching; Force measurement; Indium phosphide; Ionization; Laboratories; Leakage current; Substrates;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1979.19752

Filename

1480330