Title :
WA-B2 on the memory behavior of thin-film electroluminescent devices
Author :
Alt, P.M. ; Howard, W.E. ; Sahni, Onkar
fDate :
11/1/1979 12:00:00 AM
Keywords :
Current measurement; Electroluminescent devices; Electron traps; Interface states; Luminescence; Optical films; Thin film devices; Tunneling; Voltage; Zinc compounds;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1979.19763
