Title :
Bit-Error-Rate Measurements of RSFQ Shift Register Memories
Author :
Hikida, Tomohiro ; Fujiwara, Kan ; Yoshikawa, Nobuyuki ; Fujimaki, Akira ; Terai, Hirotaka ; Yorozu, Shinichi
Author_Institution :
Yokohama Nat. Univ., Yokohama
fDate :
6/1/2007 12:00:00 AM
Abstract :
Error rates of rapid-single-flux-quantum (RSFQ) shift register memories were investigated using a high-speed error-rate measurement system in order to demonstrate their reliability and stability. We designed and implemented an 8 times 8-bit shift register memory using the CONNECT cell library and the SRL 2.5 kA/cm2 Nb process. The total number of Josephson junctions including the test system is 4184, and the circuit area is 2.1 mm times 3.2 mm. We measured the error rates of every storage node by reading out the data 216 times at the clock frequency of 16 GHz. The measured error rates were lower than 10-10 with DC bias margin better than plusmn5%.
Keywords :
clocks; shift registers; CONNECT cell library; RSFQ shift register memories; bit-error-rate measurements; circuit reliability; circuit stability; clock frequency; frequency 16 GHz; rapid-single-flux-quantum; Circuit stability; Circuit testing; Clocks; Error analysis; Frequency measurement; Josephson junctions; Libraries; Niobium; Shift registers; System testing; Bit-error rate; Josephson logic; Josephson memories; RSFQ circuits; superconducting integrated circuits;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2007.898689
