Title :
Dynamic Idd test circuit for mixed signal ICs
Author :
Arguelles, J. ; Martinez, Manuel ; Bracho, S.
Author_Institution :
Dept. de Electron., Cantabria Univ., Santander
fDate :
3/17/1994 12:00:00 AM
Abstract :
Built-in test circuitry is proposed that uses the dynamic supply current consumption of a mixed signal circuit under test for a unified fault detection method. Simulation waveform are reported to illustrate the performance of the proposed circuitry
Keywords :
built-in self test; electric sensing devices; integrated circuit testing; mixed analogue-digital integrated circuits; IC testing; built-in test circuitry; dynamic Idd test circuit; dynamic supply current consumption; mixed signal ICs; unified fault detection method;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19940343
