DocumentCode
1067001
Title
Static induction transistor image sensors
Author
Nishizawa, Jun-ichi ; Tamamushi, Takashige ; Ohmi, Tadahiro
Author_Institution
Tohoku University, Sendai, Japan
Volume
26
Issue
12
fYear
1979
fDate
12/1/1979 12:00:00 AM
Firstpage
1970
Lastpage
1977
Abstract
New image sensors, based on the operational principle of static induction transistor (SIT), are described in this paper. Two operational modes of SIT image sensors are described here. One is the electron-accumulation mode in which electrons are stored in the floating-cell region and another is the electron-depletion mode in which electrons are removed from the floating-cell region in response to optical input. The electron-depletion mode is superior to the electron-accumulation mode in the charge retention characteristics, its temperature dependence, and the operational tolerancy. The described SIT image sensors, which utilize the vertically configured SITM structure, are very promising for application in very-large-area image converters due to high-speed high-packing density, and wide dynamic range, and especially due to extremely low power dissipation.
Keywords
Capacitors; Circuits; DRAM chips; Electron optics; High speed optical techniques; Image sensors; Power dissipation; Random access memory; Read-write memory; Voltage control;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1979.19804
Filename
1480382
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