• DocumentCode
    1067001
  • Title

    Static induction transistor image sensors

  • Author

    Nishizawa, Jun-ichi ; Tamamushi, Takashige ; Ohmi, Tadahiro

  • Author_Institution
    Tohoku University, Sendai, Japan
  • Volume
    26
  • Issue
    12
  • fYear
    1979
  • fDate
    12/1/1979 12:00:00 AM
  • Firstpage
    1970
  • Lastpage
    1977
  • Abstract
    New image sensors, based on the operational principle of static induction transistor (SIT), are described in this paper. Two operational modes of SIT image sensors are described here. One is the electron-accumulation mode in which electrons are stored in the floating-cell region and another is the electron-depletion mode in which electrons are removed from the floating-cell region in response to optical input. The electron-depletion mode is superior to the electron-accumulation mode in the charge retention characteristics, its temperature dependence, and the operational tolerancy. The described SIT image sensors, which utilize the vertically configured SITM structure, are very promising for application in very-large-area image converters due to high-speed high-packing density, and wide dynamic range, and especially due to extremely low power dissipation.
  • Keywords
    Capacitors; Circuits; DRAM chips; Electron optics; High speed optical techniques; Image sensors; Power dissipation; Random access memory; Read-write memory; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1979.19804
  • Filename
    1480382