Title :
Effect of Thermal Cycling on the Electrical Characteristics of HTS SQIFs and SQUIDs
Author :
Ijsselsteijn, R.P.J. ; Schultze, V. ; Meyer, H.-G.
Author_Institution :
Inst. for Phys. High Technol., Jena
fDate :
6/1/2007 12:00:00 AM
Abstract :
In order to investigate the stability of HTS SQUIDs and SQIFs (arrays of SQUIDs with different loop size) based on YBCO bicrystal Josephson junctions we thermally cycled them in a controlled way 1000 times between 300 K and 77 K. The samples, which were partly covered with a Teflon protection layer, were electrically characterized after predetermined numbers of cycles. From these measurements the electrical parameters like critical current, normal resistance, maximum voltage modulation, width of the SQIF-peak and of the SQUID modulation, coupling inductance of the SQUID, and the maximum magnetic-field-to-voltage transfer factor were determined. Additionally, the critical current density of the YBCO-layers was determined.
Keywords :
SQUIDs; critical current density (superconductivity); high-temperature superconductors; yttrium compounds; HTS SQIF; SQIF-peak; SQUID modulation; YBCO bicrystal Josephson junction; coupling inductance; critical current density; electrical characteristic; high temperature superconductor; magnetic-field-to-voltage transfer factor; maximum voltage modulation; normal resistance; thermal cycling; Current measurement; Electric variables; High temperature superconductors; Josephson junctions; Magnetic modulators; Protection; SQUIDs; Size control; Thermal stability; Yttrium barium copper oxide; High-temperature superconductors; SQUIDs; protective coatings; superconducting device reliability;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2007.898723
