• DocumentCode
    10671
  • Title

    An Energy-Efficient ECG Processor in 45-nm CMOS Using Statistical Error Compensation

  • Author

    Abdallah, Rami A. ; Shanbhag, Naresh R.

  • Author_Institution
    Visual & Parallel Comput. Group, Intel Corp., Hillsboro, OR, USA
  • Volume
    48
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    2882
  • Lastpage
    2893
  • Abstract
    A subthreshold ECG processor in 45-nm IBM SOI CMOS is designed to operate at the minimum energy operating point (MEOP). Statistical error compensation (SEC) is employed to further reduce energy (Emin) at the MEOP. SEC is shown to reduce Emin by 28% compared with the conventional (error-free) case while maintaining acceptable beat-detection performance. SEC enables the supply voltage to be scaled to 15% below its critical value at MEOP, while compensating for a 58% precorrection error rate pe. These results represent an improvement of 19× in beat-detection performance and 600× in pe over conventional (error-free) systems. The prototype IC consumes 14.5 fJ/cycle/1k-gate and exhibits 4.7× better energy efficiency than the state of the art while tolerating 16× more voltage variations.
  • Keywords
    CMOS integrated circuits; biomedical electronics; electrocardiography; error compensation; error correction; silicon-on-insulator; IBM SOI CMOS; energy-efficient ECG processor; minimum energy operating point; precorrection error rate; size 45 nm; statistical error compensation; subthreshold ECG processor; Accuracy; Computer architecture; Electrocardiography; Error analysis; Error compensation; Robustness; Timing; Error resiliency; robust design; statistical computing; subthreshold; ultralow power; voltage overscaling;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2013.2280055
  • Filename
    6600915