Title :
An Energy-Efficient ECG Processor in 45-nm CMOS Using Statistical Error Compensation
Author :
Abdallah, Rami A. ; Shanbhag, Naresh R.
Author_Institution :
Visual & Parallel Comput. Group, Intel Corp., Hillsboro, OR, USA
Abstract :
A subthreshold ECG processor in 45-nm IBM SOI CMOS is designed to operate at the minimum energy operating point (MEOP). Statistical error compensation (SEC) is employed to further reduce energy (Emin) at the MEOP. SEC is shown to reduce Emin by 28% compared with the conventional (error-free) case while maintaining acceptable beat-detection performance. SEC enables the supply voltage to be scaled to 15% below its critical value at MEOP, while compensating for a 58% precorrection error rate pe. These results represent an improvement of 19× in beat-detection performance and 600× in pe over conventional (error-free) systems. The prototype IC consumes 14.5 fJ/cycle/1k-gate and exhibits 4.7× better energy efficiency than the state of the art while tolerating 16× more voltage variations.
Keywords :
CMOS integrated circuits; biomedical electronics; electrocardiography; error compensation; error correction; silicon-on-insulator; IBM SOI CMOS; energy-efficient ECG processor; minimum energy operating point; precorrection error rate; size 45 nm; statistical error compensation; subthreshold ECG processor; Accuracy; Computer architecture; Electrocardiography; Error analysis; Error compensation; Robustness; Timing; Error resiliency; robust design; statistical computing; subthreshold; ultralow power; voltage overscaling;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2013.2280055