Title :
Preliminary results obtained from novel CdZnTe pad detectors
Author :
Tumer, T.O. ; Joyce, David C. ; Yin, Shi ; Willson, Paul D. ; Parnham, Kevin B. ; Glick, Bruce
Author_Institution :
NOVA R&D Inc., Riverside, CA, USA
fDate :
6/1/1996 12:00:00 AM
Abstract :
CdZnTe pad detectors with a novel geometry and approximately 1 mm 2 pad sizes are being developed. These detectors have been specially designed for high energy resolution up to 300 keV energies. The contacts are produced through a unique technique developed by eV Products to achieve high reliability low resistance coupling to the substrate. A ceramic carrier is developed for low capacitance coupling of the detectors to NOVA´s FEENA chip. The detectors have been tested using the ultra low noise single and 3-channel amplifiers developed by eV Products. The CdZnTe detectors are tested for dark current. The charge energy resolutions and collection times are also measured using natural radiation sources. The measured detector parameters and the test results are showing that linear pad arrays can have good uniformity and excellent application potential for imaging X-rays and gamma-rays. The results obtained for the energy resolution are excellent for spectroscopy applications in nuclear physics, and the short charge collection time can be used for fast imaging
Keywords :
II-VI semiconductors; X-ray detection; X-ray spectrometers; amplifiers; cadmium compounds; dark conductivity; detector circuits; gamma-ray detection; gamma-ray spectrometers; nuclear electronics; semiconductor counters; zinc compounds; 0 to 300 keV; 3-channel amplifiers; CdZnTe; NOVA FEENA chip; X-ray imaging; ceramic carrier; charge energy resolutions; collection times; contacts; dark current; fast imaging; gamma-ray imaging; high energy resolution; high reliability low resistance coupling; linear pad arrays; low capacitance coupling; pad detectors; spectroscopy applications; ultralow noise single amplifiers; Capacitance; Ceramics; Contact resistance; Detectors; Energy resolution; Geometry; Low-noise amplifiers; Optical imaging; Semiconductor device measurement; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on