DocumentCode :
1067270
Title :
Breakdown Mechanisms in Sulphur-Hexafluoride
Author :
Malik, N.H. ; Qureshi, A.H.
Author_Institution :
Electrical Engineering Department, University of Windsor, Windsor, Ontario, Canada N9B 3P4
Issue :
3
fYear :
1978
fDate :
6/1/1978 12:00:00 AM
Firstpage :
135
Lastpage :
145
Abstract :
The well known breakdown theories, Townsend´s generation mechanism and the streamer mechanism, are reviewed and applied to the results of breakdown in the strongly electronegative gas, sulphur-hexafluoride. Experimental results reported in the literature on the breakdown behavior of sulphur-hexafluoride are examined in the light of these theories. The breakdown theories are used for the estimation of the breakdown voltages in pure SF6. Other factors that may affect the breakdown characteristics of SF6 have been discussed. Further areas of work have been proposed in order to obtain a better understanding of the breakdown mechanism.
Keywords :
Breakdown voltage; Chemicals; Circuit stability; Dielectric breakdown; Electric breakdown; Electrons; Gases; Insulation; Ionization; Sulfur hexafluoride;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/TEI.1978.298121
Filename :
4080525
Link To Document :
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