DocumentCode :
1067354
Title :
Development of the pulse-shape discrimination LSI for Astro-E Hard X-ray Detector
Author :
Ezawa, H. ; Hirayama, M. ; Kamae, T. ; Kubo, H. ; Matsuzaki, K. ; Nagata, K. ; Saito, Y. ; Ikeda, H. ; Tsukada, K. ; Ozawa, H. ; Takahashi, T. ; Murakami, H. ; Sano, Y. ; Shimizu, K.
Author_Institution :
Dept. of Phys., Tokyo Univ., Japan
Volume :
43
Issue :
3
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
1521
Lastpage :
1526
Abstract :
We have developed a pulse-shape discrimination LSI for the Astro-E Hard X-ray Detector (HXD). In the detector, the X-ray and non X-ray background will be reduced drastically by use of well-type phoswich counters in the compound-eye configuration. The well-type phoswich counter will use GSO(Ce) or YAP(Ce) scintillator for its detection part, and well-shaped BGO for the shielding part. The pulse-shape discriminator (PSD) described here will be used to select clean hits on the detection part, rejecting those depositing some energy in BGO. The PSD is designed as a bipolar semi-custom LSI to reduce its power consumption and size, and to enhance its reliability. The first delivery of the PSD-LSI has been tested to be acceptable for Astro-E HXD
Keywords :
X-ray astronomy; X-ray detection; artificial satellites; astronomical instruments; bipolar analogue integrated circuits; detector circuits; discriminators; integrated circuit reliability; nuclear electronics; pulse shaping circuits; shielding; solid scintillation detectors; Astro-E Hard X-ray Detector; Bi12SiO20:Ce; Bi4Ge3O12; GSO(Ce) scintillator; YAP(Ce) scintillator; YAP:Ce; YAlO3:Ce; bipolar semicustom LSI; compound-eye configuration; power consumption; pulse-shape discrimination LSI; reliability; shielding part; well-shaped BGO; well-type phoswich counters; Astronomy; Large scale integration; Photomultipliers; Physics; Pulse amplifiers; Pulse measurements; Radiation detectors; Satellites; X-ray detection; X-ray detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.507096
Filename :
507096
Link To Document :
بازگشت