• DocumentCode
    1067393
  • Title

    Experimental observation of large-signal behavior in trapped domain transferred electron devices

  • Author

    Yokoo, Kuniyoshi ; Ono, Shoichi ; Aishima, Asuo

  • Author_Institution
    Tohoku University, Sendai, Japan
  • Volume
    27
  • Issue
    1
  • fYear
    1980
  • fDate
    1/1/1980 12:00:00 AM
  • Firstpage
    208
  • Lastpage
    212
  • Abstract
    The large-signal behavior of the anode trapped domain diodes (n-GaAs) is experimentally studied. It was confirmed that the negative conductance of the diodes was bell shaped as a function of the magnitude of the terminal RF voltage, as predicted by the authors. The injection operation characteristics of the diodes were clarified: An oscillation can be initiated by applying an external microwave signal where a frequency difference between the oscillation and the signal is less than 20 MHz. While if the frequency difference becomes greater than 20 MHz, quenching behavior of oscillation is appeared due to the bell-shaped negative conductance of trapped domain diodes.
  • Keywords
    Anodes; Doping; Electron devices; Electron traps; Equations; Gunn devices; Implants; Radio frequency; Semiconductor diodes; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.19841
  • Filename
    1480634