DocumentCode :
1067393
Title :
Experimental observation of large-signal behavior in trapped domain transferred electron devices
Author :
Yokoo, Kuniyoshi ; Ono, Shoichi ; Aishima, Asuo
Author_Institution :
Tohoku University, Sendai, Japan
Volume :
27
Issue :
1
fYear :
1980
fDate :
1/1/1980 12:00:00 AM
Firstpage :
208
Lastpage :
212
Abstract :
The large-signal behavior of the anode trapped domain diodes (n-GaAs) is experimentally studied. It was confirmed that the negative conductance of the diodes was bell shaped as a function of the magnitude of the terminal RF voltage, as predicted by the authors. The injection operation characteristics of the diodes were clarified: An oscillation can be initiated by applying an external microwave signal where a frequency difference between the oscillation and the signal is less than 20 MHz. While if the frequency difference becomes greater than 20 MHz, quenching behavior of oscillation is appeared due to the bell-shaped negative conductance of trapped domain diodes.
Keywords :
Anodes; Doping; Electron devices; Electron traps; Equations; Gunn devices; Implants; Radio frequency; Semiconductor diodes; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1980.19841
Filename :
1480634
Link To Document :
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