DocumentCode
1067393
Title
Experimental observation of large-signal behavior in trapped domain transferred electron devices
Author
Yokoo, Kuniyoshi ; Ono, Shoichi ; Aishima, Asuo
Author_Institution
Tohoku University, Sendai, Japan
Volume
27
Issue
1
fYear
1980
fDate
1/1/1980 12:00:00 AM
Firstpage
208
Lastpage
212
Abstract
The large-signal behavior of the anode trapped domain diodes (n-GaAs) is experimentally studied. It was confirmed that the negative conductance of the diodes was bell shaped as a function of the magnitude of the terminal RF voltage, as predicted by the authors. The injection operation characteristics of the diodes were clarified: An oscillation can be initiated by applying an external microwave signal where a frequency difference between the oscillation and the signal is less than 20 MHz. While if the frequency difference becomes greater than 20 MHz, quenching behavior of oscillation is appeared due to the bell-shaped negative conductance of trapped domain diodes.
Keywords
Anodes; Doping; Electron devices; Electron traps; Equations; Gunn devices; Implants; Radio frequency; Semiconductor diodes; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1980.19841
Filename
1480634
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