Title :
Post-radiation memory correction using differential subtraction for PHENIX
Author :
Britton, C.L., Jr. ; Wintenberg, A.L. ; Young, G.R. ; Awes, T.C. ; Womac, M. ; Kennedy, E.J. ; Smith, R.S.
Author_Institution :
Oak Ridge Nat. Lab., TN, USA
fDate :
6/1/1996 12:00:00 AM
Abstract :
In colliders such as RHIC, the radiation levels are well below those of colliders such as LHC. If the radiation that is present affects the entire analog memory unit (AMU) in a uniform fashion, then a real-time correction should be able to be performed to correct any changes seen in the memory as well as the induced correlated noise from detector pickup, thus precluding the need for a more expensive rad-hard process. This paper will present testing on memories fabricated in a `soft´ process and exposed to ionizing radiation. We used a single pipeline as a reference to be subtracted on a cell-by-cell basis from each pipe during read out and investigated the spatial effects of using different pipes for the reference. Use of this method reduced the noise which was common to all pipes (common-mode noise) and thus reduced both common-mode input noise and pattern noise generated from address lines being exercised on the AMU
Keywords :
analogue storage; detector circuits; nuclear electronics; semiconductor device noise; PHENIX; address lines; analog memory unit; cell-by-cell basis; common-mode input noise reduction; detector pickup; differential subtraction; induced correlated noise; ionizing radiation; pattern noise reduction; post-radiation memory correction; radiation levels; real-time correction; single pipeline; soft process; Analog memory; Circuit noise; Laboratories; Large Hadron Collider; Noise cancellation; Noise generators; Noise reduction; Radiation detectors; Radiation hardening; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on