DocumentCode
1067466
Title
Analysis of radiation damaged HPGe detectors with a new algorithm
Author
Koenen, M. ; Bruckner, J. ; Fabian, U. ; Kruse, H. ; Wanke, H. ; Schroeder, A.N.F. ; Stan, R. ; Evans, L.G. ; Trombka, J.I. ; Drake, D.M. ; Englert, P.A.J. ; Dempsey, J.
Author_Institution
Max-Planck-Inst. fur Chem., Mainz, Germany
Volume
43
Issue
3
fYear
1996
fDate
6/1/1996 12:00:00 AM
Firstpage
1570
Lastpage
1575
Abstract
After being irradiated by high-energy protons, the energy resolution of HPGe detectors degrade extensively. Resulting line shapes depend mostly on detector geometry and doping type. To improve the analysis of measured gamma-ray spectra of HPGe detectors, new algorithms were developed. Since trapping in radiation damaged HPGe detectors is predominantly hole trapping, the full energy peak is the integration of absorption events produced within the detector at various. Distances from the positive contact. Implementing that information into fit algorithms, peaks produced by detectors irradiated with 6-108 protons/cm2 could be analyzed. The tailing structure at the low energy side was included in the algorithm. Analog algorithms were successfully applied to damaged coaxial detectors of either doping type. Using these algorithms, it was possible to evaluate transients in damaged detectors after having been exposed to room temperature. Also, the development of tail broadening could be examined
Keywords
gamma-ray detection; germanium radiation detectors; hole traps; proton effects; Ge; absorption events; damaged coaxial detectors; detector geometry; energy resolution; fit algorithms; high-energy protons; hole trapping; measured gamma-ray spectra; radiation damaged HPGe detectors; tail broadening; tailing structure; Algorithm design and analysis; Degradation; Doping; Energy resolution; Event detection; Gamma ray detection; Geometry; Protons; Radiation detectors; Shape;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.507105
Filename
507105
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