DocumentCode :
1067744
Title :
Modeling and experimental simulation of the low-frequency transfer inefficiency in bucket-brigade devices
Author :
Scott, David B. ; Chamberlain, Savvas G.
Author_Institution :
Texas Instruments, Dallas, TX
Volume :
27
Issue :
2
fYear :
1980
fDate :
2/1/1980 12:00:00 AM
Firstpage :
405
Lastpage :
414
Abstract :
The work presented in this paper extends the available theory and it also presents a model for the low-frequency charge transfer in MOS bucket-brigade devices (BBD´s). Our new theory which characterizes the low-frequency component of transfer inefficiency in terms of the subthreshold current is frequency independent and it incorporates both channel-length and barrier-height modulations. This model was verified experimentally on simulated BBD´s. After proving both theoretically and experimentally that the low-frequency transfer inefficiency of BBD devices is due to subthreshold current, we successfully used this knowledge to design an improved BBD device. This improved device includes only one extra ion-implantation step relative to the original BBD device. An ion implant is used in part of the BBD channel.
Keywords :
Charge coupled devices; Councils; Current measurement; Electron devices; Fabrication; Frequency; Implants; Information processing; MOSFET circuits; Subthreshold current;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1980.19876
Filename :
1480669
Link To Document :
بازگشت