DocumentCode
1068034
Title
One-dimensional analysis of reverse recovery and dv/dt triggering characteristics for a thyristor
Author
Fukui, Hiroshi ; Naito, Masayoshi ; Terasawa, Yoshio
Author_Institution
Hitachi Ltd., Kujimachi, Hitachi, Ibaraki, Japan
Volume
27
Issue
3
fYear
1980
fDate
3/1/1980 12:00:00 AM
Firstpage
596
Lastpage
602
Abstract
Reverse recovery and
triggering characteristics of a thyristor are analyzed using a one-dimensional numerical model, which consists of the solutions of the full set of semiconductor device equations, including the effect of the shorted emitter. The calculated waveforms of the anode voltage and current are in good agreement with the experimental ones. The reverse recovery characteristic is discussed for the case of an inductive load, and the dependence of capacitive and resistive components of the space-charge region on residual carriers in the n base is discussed on the basis of carrier distributions. Also, the role of the shorted emitter on
triggering is investigated in connection with the rates of supply and removal of carriers in the p base. It is shown that the shorted emitter improves
capability by causing not only a reduction in the injection efficiency of the n emitter, but also rapid turn-off of the n-p-n transistor section of a thyristor.
triggering characteristics of a thyristor are analyzed using a one-dimensional numerical model, which consists of the solutions of the full set of semiconductor device equations, including the effect of the shorted emitter. The calculated waveforms of the anode voltage and current are in good agreement with the experimental ones. The reverse recovery characteristic is discussed for the case of an inductive load, and the dependence of capacitive and resistive components of the space-charge region on residual carriers in the n base is discussed on the basis of carrier distributions. Also, the role of the shorted emitter on
triggering is investigated in connection with the rates of supply and removal of carriers in the p base. It is shown that the shorted emitter improves
capability by causing not only a reduction in the injection efficiency of the n emitter, but also rapid turn-off of the n-p-n transistor section of a thyristor.Keywords
Analytical models; Anodes; Cathodes; Charge carrier lifetime; Equations; Numerical models; Resistors; Semiconductor devices; Thyristors; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1980.19905
Filename
1480698
Link To Document