• DocumentCode
    1068035
  • Title

    Computer simulation for the conductance of a contact interface. II

  • Author

    Nakamura, Mitsunobu ; Minowa, Isao ; Kanno, Makoto

  • Author_Institution
    Dept. of Electron. Eng., Tamagawa Univ., Tokyo, Japan
  • Volume
    11
  • Issue
    3
  • fYear
    1988
  • Firstpage
    324
  • Lastpage
    327
  • Abstract
    A global model for contact conductance has been previously proposed, and global behavior of contact conductance was studied by computer simulation based on the finite-element method (see ibid., vol.CHMT-9, p.150-5, June 1986). Another global property is studied, using the same model and method as previously described. The contact conductance of a single conducting spot is higher when the spot exists in the center of a contact interface than when the spot is close to the edges or corners. The fact can be only intuitively understood; however, it is not indicated quantitatively. The conductance of a single conducting spot is computed against the location of the spot in a contact interface, and the numerical results are illustrated. It is clearly shown that the edge effect of interface to conductance is small unless a conducting spot closely approaches the edges.<>
  • Keywords
    digital simulation; electric admittance; electrical contacts; computer simulation; contact conductance; contact interface; edge effect; finite-element method; global model; single conducting spot; Building materials; Computer interfaces; Computer simulation; Concrete; Conducting materials; Conductivity; Contact resistance; Equations; Finite element methods;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.16660
  • Filename
    16660