• DocumentCode
    1068229
  • Title

    Calibration and measurement of dielectric properties of finite thickness composite sheets with open-ended coaxial sensors

  • Author

    Ganchev, Stoyan I. ; Qaddoumi, N. ; Bakhtiari, Sasan ; Zoughi, Reza

  • Author_Institution
    Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
  • Volume
    44
  • Issue
    6
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    1023
  • Lastpage
    1029
  • Abstract
    The application of open-ended coaxial sensors for dielectric measurement of finite thickness composite sheets is studied. Expressions for calculation of the complex aperture admittance for two geometries are presented. These expressions are used to calculate the dielectric constant of infinite half-space as well as finite thickness slabs. A more efficient method of such calculations, using a personal computer, for low to medium loss dielectrics is demonstrated. The question of when a dielectric layer may be considered as infinitely thick is also addressed, and examples are presented. A different calibration technique (compared to the conventional ones) is described and successfully implemented. This calibration technique utilizes a dielectric sheet with known dielectric properties and thickness. Measurements for different airgaps between the open-ended coaxial line and the dielectric sheet are used to perform and enhance the calibration. The results of this calibration technique and several subsequent measurements are presented and discussed
  • Keywords
    calibration; dielectric measurement; nondestructive testing; airgaps; calibration technique; complex aperture admittance; dielectric constant; dielectric measurement; dielectric properties; finite thickness composite sheets; infinite half-space; open-ended coaxial line; open-ended coaxial sensors; Admittance; Apertures; Calibration; Coaxial components; Dielectric constant; Dielectric losses; Dielectric measurements; Geometry; Microcomputers; Slabs;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.475149
  • Filename
    475149