• DocumentCode
    1068373
  • Title

    A Simple Method for Breakdown Voltage Measurements in Thin Films

  • Author

    Sapieha, S. ; Wertheimer, M.R. ; Yelon, A.

  • Author_Institution
    Department of Engineering Physics Ecole Polytechnique Montreal, Quebec, Canada
  • Issue
    4
  • fYear
    1979
  • Firstpage
    229
  • Lastpage
    230
  • Keywords
    Breakdown voltage; Capacitance; Capacitors; Dielectric breakdown; Dielectric films; Dielectric thin films; Electric breakdown; Instruments; Transistors; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1979.298177
  • Filename
    4080647
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1068373