Title :
Low-voltage failures in multilayer ceramic capacitors: a new accelerated stress screen
Author :
Munikoti, Ramachandra ; Dhar, Pulak
Author_Institution :
Northern Telecom Electron. Ltd., Kanata, Ont., Canada
Abstract :
The authors present a novel method of screening out potential low-voltage failures in manufactured lots of multilayer ceramic capacitors (MLCC). This technique uses highly accelerated life testing (HALT) to eliminate quickly all the potential failures in capacitor lots. It is concluded that a single short HALT test will completely characterize the quality and reliability of ceramic capacitors, both for rated-voltage and low-voltage applications.<>
Keywords :
capacitors; life testing; reliability; MLCC; accelerated stress screen; highly accelerated life testing; low-voltage failures; manufactured lots; multilayer ceramic capacitors; quality; reliability; Acceleration; Capacitors; Ceramics; Communication industry; Insulation; Life testing; Low voltage; Nonhomogeneous media; Stress; Telecommunications;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
