Title :
Measurement of Environmental Impedance at Plasma Frequency of Josephson Junction With Microwave Enhanced Thermal Escape
Author :
Mao, Bo ; Han, Siyuan
Author_Institution :
Univ. of Kansas, Lawrence
fDate :
6/1/2007 12:00:00 AM
Abstract :
We have developed a simple and accurate method to determine the environmental impedance seen by a phase qubit at the plasma frequency of the junction by comparing the measured and simulated thermal escape rate in strong microwave field at 4.2 K. The results show that for our sample 1/Re[Y(omega)] is about 2.5 kOmega, where Re[Y(omega)] is the real part of the frequency-dependent environmental admittance.
Keywords :
electric impedance; electric impedance measurement; quantum computing; superconducting junction devices; Josephson junction; environmental Index admittance; environmental impedance; microwave enhanced thermal escape; phase qubit; plasma frequency; temperature 4.2 K; Extraterrestrial measurements; Frequency measurement; Impedance measurement; Josephson junctions; Microwave measurements; Microwave theory and techniques; Plasma measurements; Plasma simulation; Q factor; Quantum computing; Decoherence; Josephson junction; environmental impedance; quality factor; qubit;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2007.898123
