• DocumentCode
    1068535
  • Title

    A 12-b 600 ks/s digitally self-calibrated pipelined algorithmic ADC

  • Author

    Lee, Hae-Seung

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
  • Volume
    29
  • Issue
    4
  • fYear
    1994
  • fDate
    4/1/1994 12:00:00 AM
  • Firstpage
    509
  • Lastpage
    515
  • Abstract
    This paper discusses fully digital error correction and self-calibration which correct errors due to capacitor mismatch, charge injection, and comparator offsets in algorithmic A/D converters. The calibration is performed without any additional analog circuitry, and the conversion does not need extra clock cycles. This technique can be applied to algorithmic converter configurations including pipelined, cyclic, or pipelined cyclic configurations. To demonstrate the concept, an experimental 2-stage pipelined cyclic A/D converter is implemented in a standard 1.6-μm CMOS process. The ADC operates at 600 ks/s using 45 mW of power at ±2.5 V supplies. The active die area excluding the external logic circuit is 1 mm2. Maximum DNL of ±0.6 LSB and INL of ±1 LSB at a 12-b resolution have been achieved
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; comparators (circuits); error correction; linear integrated circuits; -2.5 V; 1.6 micron; 2.5 V; 45 mW; CMOS process; DNL; INL; active die area; capacitor mismatch; charge injection; comparator offsets; differential nonlinearity; digital error correction; digitally self-calibrated; integral nonlinearity; pipelined algorithmic ADC; pipelined cyclic configurations; Calibration; Capacitors; Circuits; Clocks; Delay; Error correction; Operational amplifiers; Power amplifiers; Sampling methods; Switches;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.280701
  • Filename
    280701