Title :
An efficient back-bias generator with hybrid pumping circuit for 1.5-V DRAMs
Author :
Tsukikawa, Yasuhiko ; Kajimoto, Takeshi ; Okasaka, Yasuhiko ; Morooka, Yoshikazu ; Furutani, Kiyohiro ; Miyamoto, Hiroshi ; Ozaki, Hideyuki
Author_Institution :
ULSI Lab., Mitsubishi Electr. Corp., Hyogo, Japan
fDate :
4/1/1994 12:00:00 AM
Abstract :
An efficient back-bias (Vbb) generator with a newly introduced hybrid pumping circuit (HPC) is described. This system attains a Vbb level of -1.44 V at Vcc=1.5 V, compared to a conventional system in which Vbb only reaches -0.6 V. HPC can pump without the threshold voltage (Vth) loss that conventional systems suffer. HPC is indispensable for 1.5-V DRAMs, because a Vbb level lower than -1.0 V is necessary to meet the limitations of the Vth, of the access transistor. HPC uses one NMOS and one PMOS pumping transistor. By adopting a triple-well structure at the pumping circuit area, the NMOS can be employed as a pumping transistor without minority carrier injection
Keywords :
DRAM chips; MOS integrated circuits; VLSI; 1.5 V; DRAMs; MOS technology; access transistor; back-bias generator; hybrid pumping circuit; pumping circuit area; pumping transistors; triple-well structure; Capacitors; Character generation; Circuits; Hybrid power systems; MOS devices; Power dissipation; Random access memory; Region 2; Signal generators; Threshold voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of