DocumentCode :
1068592
Title :
Accelerated life tests of ceramic capacitors
Author :
Mogilevsky, Boris M. ; Shirn, George A.
Author_Institution :
Sprague Electr. Co., N. Adams, MA, USA
Volume :
11
Issue :
4
fYear :
1988
Firstpage :
351
Lastpage :
357
Abstract :
Multilayer capacitors prepared from three different ceramics were tested under highly accelerated conditions of both voltage and temperature. Three types of breakdown were encountered: avalanche, fast thermal degradation, and diffusion or wearout. The goal was to determine whether data from highly accelerated life tests could be used to plot failure curves that would match those made at rated voltage and temperature conditions. Thus, the emphasis was on the wearout mode. The voltage accelerations were as high as 80% of the electric breakdown and yielded voltage exponents between 3 and 7. The temperatures were as high as 250 degrees C. There was an activation energy for the temperature acceleration that closely matched that of the leakage current. Fast thermal degradation was encountered only at the high corner of the temperature-voltage matrix and was easily recognized. Data equivalent to those for a 1000-h slightly accelerated life test can be generated in less than 1 day.<>
Keywords :
capacitors; failure analysis; life testing; activation energy; avalanche; ceramic capacitors; diffusion; failure curves; fast thermal degradation; highly accelerated conditions; leakage current; life tests; multilayer capacitors; temperature; temperature-voltage matrix; voltage; voltage exponents; wearout; Acceleration; Avalanche breakdown; Breakdown voltage; Capacitors; Ceramics; Life estimation; Life testing; Nonhomogeneous media; Temperature; Thermal degradation;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.16667
Filename :
16667
Link To Document :
بازگشت